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Significant Events
February 2009
 Dr. Reza Ghaffarian received the “Top Reviewer in 2008” Certificate from the Microelectronics Reliability Journal for exceptional contribution to the quality of microelectronics reliability. This is the second consecutive year that he has received this Certificate. He is on the journal review board and has been actively reviewing paper submittals on package assembly reliability for the last ten years. Most activities are extracurricular and some are funded by the NASA Electronic Parts and Packaging (NEPP) Program through the JPL Assurance Technology Program Office (502).
December 2008
Dr. Reza Ghaffarian received “Top Reviewer in 2007” Certificate from the Microelectronics Reliability Journal for exceptional contribution to
the quality of microelectronics reliability. He is on the journal review board and has been actively reviewing paper submittals for the last ten years.
Most activities are extracurricular and some are funded by the NASA Electronic Parts and Packaging (NEPP) Program through the JPL Assurance Technology Program Office.
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